(Also offered as CHEM 5301.) Lecture on sample preparation and analyses for optical and electron microscopy methods including scanning electron microscopy, transmission electron microscopy, energy dispersive X-ray analysis, focused ion beam methods, and electron energy loss spectroscopy.

(Also offered as CHEM 5302.) Lecture on sample preparation and analyses for X-ray diffraction, X-ray fluorescence, X-ray imaging, Rietveld refinement, Thin Film X-ray Analyses, and In Situ methods.

(Also offered as CHEM 5303.) Lecture on sample preparation and analyses, for characterization of compositions of materials. Methods to be discussed include titrations, atomic absorption, inductively coupled plasma mass spectrometry, infrared, Raman, Ultraviolet visible, fluorescence, chromatography, and mass spectrometry.

(Also offered as CHEM 5304.) Lecture on sample preparation and analyses for surfaces and interfaces, including scanning Auger microscopy, secondary ion mass spectrometry, X-ray photoelectron spectroscopy, contact angle measurements, and temperature program methods.