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4241. Nanomaterials Characterization and Application

3.00 credits

Prerequisites: MSE 2002

Grading Basis: Graded

Introduces materials characterization and applications at the nanoscale. Standard and advanced methods in Scanning Probe Microscopy, Electron Microscopy, and Focused Ion Beams are presented. Self-Assembled and Lithographically defined structures are treated. Nanoscale particles, tubes, films, and structures are discussed. Applications for enhanced mechanical, electronic, magnetic, optical, and biological properties are described. Societal implications including performance, costs, environmental impacts, and health issues are addressed. Readings from modern scientific literature are assigned weekly for in-class discussions.

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