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Prerequisites: MSE 2002.
Grading Basis: Graded
Introduces materials characterization and applications at the nanoscale. Standard and advanced methods in Scanning Probe Microscopy, Electron Microscopy, and Focused Ion Beams are presented. Self-Assembled and Lithographically defined structures are treated. Nanoscale particles, tubes, films, and structures are discussed. Applications for enhanced mechanical, electronic, magnetic, optical, and biological properties are described. Societal implications including performance, costs, environmental impacts, and health issues are addressed. Readings from modern scientific literature are assigned weekly for in-class discussions.
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