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Prerequisites: MATH 2110Q; open to juniors or higher.
Grading Basis: Graded
Foundation of quality control and reliability in manufacturing systems. Probability and statistics, principles and methods of modern quality control in manufacturing, Six Sigma, control charts for measurement and attribute data, development and utilization of control charts, manufacturing process capability studies, ANOVA and linear regression of measurement data, experimental design, response surface and Taguchi methodology, acceptance sampling, reliability prediction and modeling in manufacturing systems.
Last Refreshed: 17-SEP-19 05.20.16.405317 AM
|1198 17437 1 001||Fall 2019||Storrs||In Person||Van Scoter, Diane||001||Reg||MoWe 4:40pm‑5:55pm
|1203 8971 1 001||Spring 2020||Storrs||In Person||Van Scoter, Diane||001||Reg||TuTh 11:00am‑12:15pm
|1203 11833 1 002||Spring 2020||Storrs||In Person||Van Scoter, Diane||002||Reg||TuTh 5:00pm‑6:15pm